June 10, 2025

CSEM and QDI Systems unveil Quantum Dot CMOS Image Sensor

Swiss technology innovation centre CSEM, in collaboration with Dutch deep-tech startup QDI Systems, has developed the world’s first image sensor to directly convert X-rays into electronic signals using quantum dots (QDs) on a CMOS platform. This revolutionary approach enables compact, low-cost, and scalable wide-spectrum imaging—from X-rays through visible to short-wave infrared (SWIR)—with applications ranging from safer medical diagnostics to advanced industrial inspection and intelligent recycling.

The sensor leverages a spray-coated layer of quantum dots, nanoscale semiconductor crystals tuned to absorb different wavelengths, deposited directly onto standard CMOS chips—the same cost-efficient platform used in smartphones. This direct-conversion design eliminates the need for bulky scintillators, complex hybrid bonding, or expensive materials like InGaAs, unlocking a new class of lightweight and affordable sensors.

Key technical benefits include:

  • Direct X-ray detection with high spatial resolution
  • Sensitivity across 400–1300 nm, including visible, near-infrared, and SWIR
  • Nearly 100% fill factor, preserving pixel density and power efficiency

Read more on the PRO Flextronics website.

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