Next Generation SWIR Imaging

Short-wave infrared (SWIR) refers to the light wavelength range of 900 nm to 2,500 nm. SWIR sensors can be used for a variety of application - from silicon wafer inspection, to machine vision, security and defense, and consumer electronics. Due to the current high cost of traditional material used, such as indium gallium arsenide (InGaAs), accessibility and scalability of SWIR technologies have long been limited. At QDI systems, we have developed a proprietary technology, based on our quantum dots InQs™ and are able to address these challenges head on. Read on to learn more!

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Benefits of QD Technology for SWIR

Cost through scale

Cost through scale

Cost through scale

One of our goals is to increase the field of use and adoption levels of SWIR imaging by making the technology more scalable and affordable for all industries that could benefit from it. As a result of our R&D efforts, our quantum dots material is already able to fulfil performance requirements set by even large electronic manufacturers at a fraction of the price of InGaAs.

Unique technology

Unique technology

Unique technology

Our sensor technology relies on leveraging the remarkable properties of quantum dots as an alternative to InGaAs. Our material possesses the ability to absorb light from the UV and visible to the short-wave infrared spectral range – thus covering nearly the entire light spectrum for a variety of applications. Absorption and emission profiles can be readily tuned in, simply by changing the size of the quantum dots, which enables us to customise our technology to the specific needs of your application.

Broad spectral range

Broad spectral range

Broad spectral range

With our technology, a wide spectral range with just one image sensor is possible! Our standard spectral range is from 400 to 1700 nm but extendable up to 2500 nm, depending on your application needs.

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How it works

Quantum dots & SWIR

Meet Our 2nd Gen Evaluation SWIR camera

  • Resolution: 640×512 pixels
  • Sensitivity range: 400-1700nm (and X-ray)
  • Pixel pitch: 15 μm
  • Max frame rate: 50 fps
  • Low/high gain and black sun effect prevention modes
  • Image processing pipeline with 14-bit precision
  • Min exposure time 200 ns
  • External trigger possibility (gated imaging)
  • EQE (SWIR range): >20%
  • TEC module for stabilization
  • Dimensions: 68x51x51 mm
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Application: Moisture Detection

Quantum dot-based SWIR sensors are highly effective for moisture detection as water has strong and distinct absorption features in SWIR wavelengths – it appears nearly black. Our detectors can precisely identify even small amounts of moisture e.g. trapped within materials or layered beneath coating. This application enables manufacturers to catch humidity-related defects early, prevent corrosion or delamination, and maintain strict environmental control. In industries where moisture can compromise product reliability or process stability, quantum dot-based SWIR sensors provide a fast and reliable way to ensure consistent quality.

The video on the right demonstrates the change in appearance in a stroopwafel that absorbed moisture through contact with steam.

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Application: Fill Levels Detection

There are many instances where accurate measurement and identification of liquid in opaque containers is required. Using a backlight, in conjunction with a fixed-position SWIR camera, an accurate measurement can easily be taken.

An example of real-world application would be that of a water bottling facility. Water absorbs SWIR wavelengths in the ~1450nm region. High-moisture areas return a darker SWIR image, while any plastics or ink on the container itself would appear transparent. While the human eye would fail to gauge the fill-level in an opaque container, with a SWIR liquid fill level inspection, it is possible to ensure that all bottles leaving the facility are sufficiently and uniformly filled in.

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Application: Silicon Inspection

Our quantum-dots SWIR sensors offer high sensitivity, tunable spectral response, and low-noise performance, making them ideal for silicon wafer inspection.

In SWIR wavelengths, all silicon wafers appear transparent when backlit, as demonstrated in the video on the right. Our sensors can look beneath the surface and detect defects, micro-cracks, voids, and contamination which would otherwise be invisible. This enables earlier detection of yield-limiting issues, tighter process control, and more reliable quality assurance. In a manufacturing environment where even microscopic defects can derail device performance, quantum-dot SWIR sensors provide a powerful, cost-effective way to safeguard yield and maintain the high standards demanded by advanced semiconductor production.

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Application: Hot object visualisation

Another possibility for using our SWIR technology is for visualising hot objects – temperature measurement or estimation of objects when temperatures are around 140 °C and above. This is useful in industrial furnace monitoring, detection of impurities in molten metal, and glass inspection at manufacturing plants.

Different temperatures reflect different brightness levels in the SWIR spectrum; generally speaking, the brighter the spot – the higher the temperature.

In the videos on the right, we can see how much more prominent the SWIR footage is in terms of reflecting the high temperature of the glass being heated.

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Application: Food Inspection

A frequent challenge in food manufacturing is identifying contaminants, such as foreign objects, in order to maintain quality standards. In the photographs on the left, we’re demonstrating how our SWIR camera can be used in food inspection. In SWIR, artificial coffee beans and other contaminants can be clearly distinguished from real coffee beans.

 

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Application: Plastic Sorting

Sorting any mixture of materials manually is time-consuming, labour-intensive, and potentially hazardous.

SWIR imaging can be used to quickly and efficiently sort materials, reducing time and cost, and increasing overall safety. In the example on the left, different types of plastic, varying in their composition, recyclability, and other structural features, are easily distinguishable through SWIR imaging.

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